Category Archives: Site News

About the method

Posted on 21 April 2011 by Admin

Currently, none of the manufactured scanning electron microscopes do not allow measure the size of nanostructure in directions not lying in the plane of projection. But even in the plane projections transition from the object image to true size of … Continue reading →

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The Solution

Posted on 29 March 2011 by Admin

Added a section dedicated to solving the problem of output control in the field of nanotechnology, using methods of scanning electron microscopy (SEM). Given a scientific justification of the proposed solutions, explains the basic principles of the approach and possible … Continue reading →

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Articles section updated

Posted on 18 March 2011 by Admin

An article “New Approach to Metrology in Nanotechnology” uploaded. Published in Technical Physics Letters (Pis’ma v Zhurnal Tekhnicheskoі Fiziki), 2010, Vol. 36, No. 20, pp. 21–28. Notions of a fractional method of control in nanotechnology are presented and a key … Continue reading →

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From the creators of the site

Posted on 10 March 2011 by Admin

The problem of measurement in the nanotechnology industry – a key at this time. This task involved many scientific teams worldwide. But an adequate idea of ​​a solution of the characterization of large arrays of nanoscale objects is not currently … Continue reading →

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