Author Archives: Admin

In memory of Sergei Kirillovich Maksimov

Posted on 30 August 2020 by Admin

Источник: Известия высших учебных заведений, том 20, №3 5 мая 2015 г. ушел из жизни известный ученый, доктор физико-матема-тических наук, профессор Максимов Сергей Кириллович – главный научный сотрудник лаборатории электронной микроскопии Национального исследовательского университета «МИЭТ». Сергей Кириллович родился 11 января … Continue reading →

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A new article added – AS COULD ASSURE SAFETY IN LARGE-SCALE MANUFACTURING OF NANOPARTICLE OF THE BIO-MEDICAL USE

Posted on 11 August 2011 by Admin

Nanoparticles provide great advantages but also great risks. Risks associating with nanoparticles are the problem of all technologies, but they increase in many times in nanotechnologies.

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Problem of safety in nanoparticle mass production and its solution by means of advanced scanning electron microscopy

Posted on 2 May 2011 by Admin

Комплексное решение проблемы структурно-морфологического контроля в массовом производстве наночастиц посредством растровой электронной микроскопии | A comprehensive solution of the problem of structural-morphological control in mass production of nanoparticles only by the use of advanced methods of scanning electron microscopy Continue reading →

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About the method

Posted on 21 April 2011 by Admin

Currently, none of the manufactured scanning electron microscopes do not allow measure the size of nanostructure in directions not lying in the plane of projection. But even in the plane projections transition from the object image to true size of … Continue reading →

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The Solution

Posted on 29 March 2011 by Admin

Added a section dedicated to solving the problem of output control in the field of nanotechnology, using methods of scanning electron microscopy (SEM). Given a scientific justification of the proposed solutions, explains the basic principles of the approach and possible … Continue reading →

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Articles section updated

Posted on 18 March 2011 by Admin

An article “New Approach to Metrology in Nanotechnology” uploaded. Published in Technical Physics Letters (Pis’ma v Zhurnal Tekhnicheskoі Fiziki), 2010, Vol. 36, No. 20, pp. 21–28. Notions of a fractional method of control in nanotechnology are presented and a key … Continue reading →

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From the creators of the site

Posted on 10 March 2011 by Admin

The problem of measurement in the nanotechnology industry – a key at this time. This task involved many scientific teams worldwide. But an adequate idea of ​​a solution of the characterization of large arrays of nanoscale objects is not currently … Continue reading →

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