Nanotechnologies offer tremendous advantages in all areas: from the defense, aerospace, computer science to medicine, pharmaceutics, food industry. However, the rapid development of nanotechnology is dangerous for the biosphere. First of all, the risk associated with nanoparticles, which constitute or principal, or a by-product of many technologies. The only way to ensure environmental safety – to provide effective control of the nanoparticles production and usage.

Production of most materials, including using properties of nano-sized particles, refers to a group of chemical industries, for which the standards-based security approach is based on the curves “dose-effect” (dosimetry) and uses the position of maximum allowable concentrations of chemicals (MPC). However, attempts to determine the range of particles that are dangerous to life or to identify technologies, where their use should be restricted, are not effective. There are no technologies allowing to form particles of only one size. Ultrafine particles with special structure and habit and, accordingly, with special catalytic properties are always presented in arrays of particles.

Thus, ecological safety in nanoregions should be based on the control set of structural and morphological fractions for each specific technology

Transmission Electron Microscopy and Scanning Probe Microscopy allow you to control the shape of individual nano-objects today, but they are not suitable for controlling large arrays, and therefore can not become the foundation of industrial control and monitoring of environmental safety that require processing a large number of nano-objects in real time.

We proposed the way to solve this problem. Our approach is theoretically verified and we starting it’s implementation.

Work being done by our team, show that a practical solution to problems of measurement exists.

This project – an attempt to share experiences and join efforts in this direction

Предлагаемые принципы экологического контроля выдвигает жесткие требования к контрольному оборудованию.