Daily Archives: 18 March 2011

An article “New Approach to Metrology in Nanotechnology” uploaded. Published in Technical Physics Letters (Pis’ma v Zhurnal Tekhnicheskoі Fiziki), 2010, Vol. 36, No. 20, pp. 21–28. Notions of a fractional method of control in nanotechnology are presented and a key … Continue reading →