Monthly Archives: March 2011

The Solution

Posted on 29 March 2011 by Admin

Added a section dedicated to solving the problem of output control in the field of nanotechnology, using methods of scanning electron microscopy (SEM). Given a scientific justification of the proposed solutions, explains the basic principles of the approach and possible … Continue reading →

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Articles section updated

Posted on 18 March 2011 by Admin

An article “New Approach to Metrology in Nanotechnology” uploaded. Published in Technical Physics Letters (Pis’ma v Zhurnal Tekhnicheskoі Fiziki), 2010, Vol. 36, No. 20, pp. 21–28. Notions of a fractional method of control in nanotechnology are presented and a key … Continue reading →

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From the creators of the site

Posted on 10 March 2011 by Admin

The problem of measurement in the nanotechnology industry – a key at this time. This task involved many scientific teams worldwide. But an adequate idea of ​​a solution of the characterization of large arrays of nanoscale objects is not currently … Continue reading →

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